Tip scanning BioAFM mit korrelativer Fluoreszenz Mikroskopie

Bio Atomic force microscope, BioAFM

• A 3 axes (XYZ) tip-scanning closed-loop atomic force microscope (AFM), providing min. 100

μm * 100 μm * (15 + 1.5) μm scan range (see Pos. 1)

• Capability to perform high speed and accuracy FD-mapping based experiments using a

small range piezo (1.5 μm) while correcting for sample tilt during the experiments using a

secondary larger range piezo (15 μm)

• Fast scanning with scan rates of up to 400 lines/sec.

• Low noise laser deflection system with 850 nm wavelength laser

• Fully automatic alignment of the laser detection system to the cantilever and

photodetector

• Fully automatic cantilever calibration regarding sensitivity and spring constant by the

thermal noise method (up to 4 MHz) or Sader method.

• Automatic, motorized 3-axes tip to surface approach up to 18 mm. Sample tilt can be

automatically corrected with the 3-axes.

• Comprehensive force-distance curve-based spectroscopy and non-resonant imaging

functionality (nrFD) to capture nano-mechanical sample properties (see Pos. 4).

• Low-noise digital high-performance AFM controller based on FPGA/PPC technology

suitable for operation in all modes.

• Data acquisition rate of force distance curves up to 1 MPixel/sec (see Pos.2).

• Sample heater for 35 mm Petri dishes and samples up to 10 mm height. With temperature

range between RT and up to 60C֯.

• Standard glass block cantilever for ease of cleaning and autoclaving.

• Capability to perform Micro-rheology on single cells or tissue samples.