Die Zuschlagsempfängerin hat das vorteilhafteste Angebot eingegeben und die höchste Gesamtpunktzahl erreicht und ist somit die Gewinnerin dieser Ausschreibung.
- Supply
Scanning Electron Microscope (SEM) for building materials
- Location
- Canton ZH
- Procuring office
- ETH Zürich - Abt. Procurement & Export Services
- Requesting office
- ETH Zürich - Dept. Bau, Umwelt und Geomatik
Awarded
Awarded to
- Portmann Instruments AG, Biel-Benken BLCHF 430’778.50
What is being procured?
Scope of work
The Institute of Building Materials (IfB) invites tenders for the purchase of a Scanning Electron Micro-scope (SEM). The system will be used for a broad range of sample analysis carried out by staff, PhD students and Postdocs, for research and well as for teaching activities. The typical applications include imaging by SEM and EDS analysis. For details refer to the specification document.
Key facts, codes and options
Key facts, codes and options
- Type of contract
- Supply
- Type of supply
- Purchase
- Procedure
- Open procedure
- Trades
- Not evident from the available publication data.
- CPV
- CPV 38511000 – Electron microscopes
- Options
- Not evident from the available publication data.
- Variants
- Not evident from the available publication data.
- Partial offers
- Not evident from the available publication data.
TEXFY assessment: Products, installations, quantities, technical specifications and exclusions are not structured fields of the publication. TEXFY does not analyse the free text on them: check the original text and the tender documents.
Official source
- simap project number
- 10213
- Publication number
- 10213-02
- Covered by international agreements
- Yes
More in the guide
Report a data error
Is something on this page wrong, missing or badly translated? We check every report. We correct our own classification and translations ourselves; what simap publishes can only be changed by the contracting authority.