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Plasma FIB/SEM for room-temperature and cryogenic applications

Contracting authority
Paul Scherrer Institut (PSI)
Place
Canton AG
Submission deadline
No deadline given
Published
15.07.2026
Procedure
Open procedure
Type
Supply
Project number
33606
CPV code
38511100 Scanning electron microscopes

Description

The new plasma-focused ion beam/scanning electron microscope to be offered will be shared for applications under cryogenic (frozen biological materials and battery materials) as well as under room temperature conditions (all types of materials). Therefore, it must be fully room temperature as well as cryo-compatible and also allow for vacuum/inert gas transfer. Its main applications will be the preparation of TEM lamellae and of pillars for X-ray investigations at the synchrotron. Material investigations (SEM imaging; FIB cross-sections), 3D FIB tomography and prototyping will be additional important topics. A fluorescence light microscope and energy dispersive X-ray spectroscopy will complement the capabilities of the instrument.

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