Awarded
- Supply
Low-temperature scanning probe microscope for in-operando device nanoscopy
- Location
- Canton ZH
- Procuring office
- Empa zentraler Einkauf
Awarded
Awarded to
- CreaTec Fischer & Co. GmbH, Erligheim/DE, ErligheimEUR 808’590.00
What is being procured?
Scope of work
The subject of this tender is a low-temperature (<3K), ultrahigh vacuum (UHV) scanning probe microscopy system with optical access to the scanned sample to pinpoint device structures in the sub-micrometer range to be investigated on the atomic level. The system provides state-of-the-art scanning tunneling microscopy (STM), spectroscopy (STS) and tuning fork based noncontact atomic force microscopy (nc-AFM), including UHV preparation chamber and load lock.
Key facts, codes and options
Key facts, codes and options
- Type of contract
- Supply
- Type of supply
- Purchase
- Procedure
- Open procedure
- Trades
- Not evident from the available publication data.
- CPV
- CPV 38514200 – Scanning probe microscopes
- Options
- Not evident from the available publication data.
- Variants
- Not evident from the available publication data.
- Partial offers
- Not evident from the available publication data.
TEXFY assessment: Products, installations, quantities, technical specifications and exclusions are not structured fields of the publication. TEXFY does not analyse the free text on them: check the original text and the tender documents.
Official source
Go to the official tender(simap.ch, opens in a new tab)
- simap project number
- 25395
- Publication number
- 25395-02
- Covered by international agreements
- Yes
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