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Tender, extract

Silizium-Testwafer und doppelseitig polierte Siliziumwafer für das Reinraumlabor des Center of MicroNanotechnology

Contracting authority
EPFL-Scientific Equipment
Place
Canton VD
Submission deadline
No deadline given
Published
30.07.2026
Procedure
Open procedure
Type
Supply
Project number
29185
CPV code
38000000 Laboratory, optical and precision equipments (excl. glasses)

Description

Original language: German

Single side polished Silicon test wafer

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