Ein hochauflösendes Cs-korrigiertes Rastertransmissionselektronenmikroskop (STEM)

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Location: Canton VD
Procuring office: EPFL-Scientific Equipment
Requesting office: EPFL – Electron Microscopy Center (CIME)

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Awarded

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Awarded to

As published on simap.ch: winner and price (with or without VAT, as stated).

Award of 17.08.20262 bids
- JEOL (EUROPE) SAS, CROISSY-SUR-SEINEEUR 3’543’720.00 without VAT

Awards of this contracting authority

Justification

Das gewählte Material entspricht zum jetzigen und voraussehbaren Zeitpunkt am ehesten unseren finanziellen Mitteln und Bedürfnissen (Sicherung der Investitionen) unter Berücksichtigung der schnellen Entwicklung der Anforderungen in der Forschung.

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What is being procured?

Scope of work

Language of the publication

Die EPFL beabsichtigt, ein hochauflösendes Cs-korrigiertes Rastertransmissionselektronenmikroskop (STEM) anzuschaffen, das in die Elektronenmikroskopie-Plattform der EPFL, CIME, integriert werden soll.

Zusätzlich zu den routinemäßigen, konventionellen TEM-Operationen wie BF/DF-Abbildungen und ausgewählter Bereichsbeugung wird das neue Mikroskop dazu dienen, die Nanostruktur und chemische Zusammensetzung von Proben im Bereich der Materialwissenschaften, Physik und Chemie mit atomarer Auflösung zu untersuchen. Es wird auch von unerfahrenen Anwendern in der Mikroskopie bedient werden, die Cs-korrigierte Mikroskopie-Techniken benötigen. Die Bedienung und Justierung sollte intuitiv sein und keine langjährige Erfahrung in Transmissionselektronenmikroskopie erfordern.

Das Mikroskop sollte den Wechsel von Abbildungstechniken und Hochspannungen innerhalb eines angemessenen Zeitraums ermöglichen und die vollständigen Spezifikationen erfüllen. In der Regel muss ein HT-Wechsel innerhalb einer einzigen Sitzung (einem halben Tag) möglich sein.

Key facts, codes and options

Type of contract: Supply
Type of supply: Purchase
Procedure: Open procedure
Trades: Not evident from the available publication data.
CPV: CPV 38511000 – Electron microscopes
Options: Not evident from the available publication data.
Variants: Not evident from the available publication data.
Partial offers: Not evident from the available publication data.

TEXFY assessment: Products, installations, quantities, technical specifications and exclusions are not structured fields of the publication. TEXFY does not analyse the free text on them: check the original text and the tender documents.

Market data for this service

From awards published on simap.ch, without rankings and without rating companies.

Comparable awards

Laboratory and measuring equipment, canton of Vaud, last 12 months

39 awards, bids (median): 2.

Awards: Laboratory and measuring equipment

Range of award prices

Laboratory and measuring equipment, canton of Vaud, last 12 months

CHF 316’01510 % of the prices were lower

CHF 534’892Median: half were lower

CHF 2’060’00010 % of the prices were higher

8 out of 10 award prices were between CHF 316’015 and CHF 2’060’000.

From 17 published award prices in CHF from 02.12.2025 to 09.11.2026, with or without VAT, as published. A single contract can differ widely.

Official source

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simap project number: 32223
Publication number: 32223-02
Covered by international agreements: Yes

Checked against simap: 10.11.2026, 18:02

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