Awarded

Supply

Ein serielles Block-Face-Rasterelektronenmikroskop

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Location: Canton VD
Procuring office: EPFL-Scientific Equipment
Requesting office: EPFL – Platform of Bio Electron Microscopy (PTBIOEM)

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Awarded

According to the simap publication. Values that are not given are deliberately missing here.

Awarded to

As published on simap.ch: winner and price (with or without VAT, as stated).

Award of 15.09.20253 bids
- FEI Europe B.V., EindhovenEUR 520’280.00 without VAT

Awards of this contracting authority

Justification

Das gewählte Material entspricht zum jetzigen und voraussehbaren Zeitpunkt am ehesten unseren finanziellen Mitteln und Bedürfnissen (Sicherung der Investitionen) unter Berücksichtigung der schnellen Entwicklung der Anforderungen in der Forschung.

AI summary

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Services
Requirements
Conditions
Dates
Award criteria

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What is being procured?

Scope of work

Language of the publication

Die EPFL beabsichtigt, ein serielles Block-Face-Rasterelektronenmikroskop anzuschaffen, das für die hochauflösende Abbildung von seriellen Dünnschnitten und die Block-Face-Rasterelektronenmikroskopie (SBF-SEM) konzipiert ist. Das System muss ein leicht abnehmbares Ultramikrotom für automatisierte Serienschnitte und Bildgebung enthalten. Das Mikroskop wird von Forschungsgruppen hauptsächlich im Bereich der Biowissenschaften eingesetzt und am Zentrum für Elektronenmikroskopie (CIME) der EPFL installiert.

Mindestanforderungen:

Hochauflösendes SEM mit Sekundär- und Rückstreuelektronen-Imaging

Niedervakuum-Abbildungsmodus

Integriertes In-situ-Ultramikrotom für automatisiertes Schneiden und Abbilden von Blockflächen

Automatisierte Serienbildgebung und Datenerfassung für 3D-Rekonstruktion

Fortschrittliche Ladungsminderungstechniken zur Minimierung von Bildverzerrungen bei schlecht leitenden Proben

Benutzerfreundliche Software für die Bildausrichtung, -verarbeitung und -analyse

Key facts, codes and options

Type of contract: Supply
Type of supply: Purchase
Procedure: Open procedure
Trades: Not evident from the available publication data.
CPV: CPV 38511100 – Scanning electron microscopes
Options: Not evident from the available publication data.
Variants: Not evident from the available publication data.
Partial offers: Not evident from the available publication data.

TEXFY assessment: Products, installations, quantities, technical specifications and exclusions are not structured fields of the publication. TEXFY does not analyse the free text on them: check the original text and the tender documents.

Market data for this service

From awards published on simap.ch, without rankings and without rating companies.

Comparable awards

Laboratory and measuring equipment, canton of Vaud, last 12 months

39 awards, bids (median): 2.

Awards: Laboratory and measuring equipment

Range of award prices

Laboratory and measuring equipment, canton of Vaud, last 12 months

CHF 316’01510 % of the prices were lower

CHF 534’892Median: half were lower

CHF 2’060’00010 % of the prices were higher

8 out of 10 award prices were between CHF 316’015 and CHF 2’060’000.

From 17 published award prices in CHF from 02.12.2025 to 09.11.2026, with or without VAT, as published. A single contract can differ widely.

Official source

Go to the official tender

simap project number: 16198
Publication number: 16198-02
Covered by international agreements: Yes
TED (EU): Publication on ted.europa.eu (opens in a new tab)

Checked against simap: 10.11.2026, 18:02

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Award, reasons and appeal

Contract awards in Vaud: monthly reports

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