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UHV cluster for Pulsed Laser Deposition and Sputtering of epitaxial quantum materials (PLD-SP-CL)

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Location
Canton ZH
Procuring office
Universität Zürich Assetmanagement
Go to the official tender(simap.ch, opens in a new tab)

Awarded

According to the simap publication. Values that are not given are deliberately missing here.

Awarded to

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  • Award of 10.04.20253 bids

    • Demcon TSST, EnschedeEUR 993’439.00 incl. VAT
Awards of this contracting authority

What is being procured?

Scope of work

Das Physik-Institut plant die Beschaffung eines UHV-Clusters für gepulste Laserabscheidung und Sputtern (PLD-SP-CL) von epitaktischen Heterostrukturen mit Monolagen-Präzision. Das System wird die Materialsynthese auf Oxid-Substraten mit einer Fläche von bis zu 10 x 10 mm² ermöglichen. Die PLD- und Sputterkammern müssen Basisdrücke < 10⁻⁷ mbar aufweisen und über eine Schleusenkammer für einen schnellen Probenaustausch zugänglich sein. Die PLD- und Sputterkammern müssen für den Probentransfer im Vakuum miteinander verbunden sein. Die PLD muss über in-situ RHEED zur Wachstumsüberwachung verfügen und Substrat-Temperaturen von mindestens 950°C ermöglichen. Die Sputteranlage ermöglicht das DC-Magnetron-Sputtern bei einer Substrattemperatur von bis zu 700°C. Das System muss mit der Verwendung von flag-style-type- Probenträgern und dem Transfer zu einem extern bereitgestellten Vakuumkoffer für den Transport zu anderen Ex-situ-Charakterisierungsgeräten kompatibel sein.

The Physics Institute plans the procurement of a UHV cluster for pulsed laser deposition and sputtering (PLD-SP-CL) of epitaxial heterostructures with monolayer precision. The system will enable materials synthesis on oxide substrates up to 10 x 10 mm² in area. The PLD and sputter chambers must have base pressures < 10⁻⁷ mbar, and must be accessible through a loadlock chamber for rapid sample exchange. The PLD and sputter deposition chambers must be interconnected for in-vacuum sample transfer. The PLD must have in-situ RHEED for growth monitoring and allow substrate temperatures up to at least 950°C. The sputter will allow for DC magnetron sputtering at substrate temperature up to 700°C. The system must be compatible with the use of flag-style-type sample carrier plates and transfer to an externally provided vacuum suitcase for transport to other ex-situ characterization tools.

Key facts, codes and options

Type of contract
Supply
Type of supply
Purchase
Procedure
Open procedure
Trades
Not evident from the available publication data.
CPV
  • CPV 38000000 – Laboratory, optical and precision equipments (excl. glasses)
Options
Not evident from the available publication data.
Variants
Not evident from the available publication data.
Partial offers
Not evident from the available publication data.

TEXFY assessment: Products, installations, quantities, technical specifications and exclusions are not structured fields of the publication. TEXFY does not analyse the free text on them: check the original text and the tender documents.

Official source

Go to the official tender(simap.ch, opens in a new tab)
simap project number
7983
Publication number
7983-03
Covered by international agreements
Yes

Checked against simap: 11.11.2026, 08:08

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